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Insights into the selection of 2D LA-ICP-MS (multi)elemental mapping conditions

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Abstract

There are several avenues and schools of thought on how to generate good 2D LA-ICP-MS (multi)elemental maps. Especially with the recent advent of “fast” LA cells and the use of simultaneous ICP-TOFMS detectors, instead of the commonly used sequential ICP-QMS detectors, the playing field has changed radically. Generally, data are generated in line scanning mode by pulsed laser ablation of the surface and ICP-MS sampling (signal integration) of one or more pulses. In the imaging process we may encounter all kinds of imaging artifacts such as blur, smear, aliasing and noise that may deteriorate the image quality. In this paper deeper insights into the selection of optimal conditions for fast and high-quality 2D LA-ICP-MS (multi)elemental mapping are given to circumvent or minimize these artifacts based on a modeling approach.

Graphical abstract: Insights into the selection of 2D LA-ICP-MS (multi)elemental mapping conditions

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Publication details

The article was received on 11 May 2019, accepted on 25 Jul 2019 and first published on 29 Jul 2019


Article type: Paper
DOI: 10.1039/C9JA00166B
J. Anal. At. Spectrom., 2019, Advance Article

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    Insights into the selection of 2D LA-ICP-MS (multi)elemental mapping conditions

    J. T. van Elteren, V. S. Šelih and M. Šala, J. Anal. At. Spectrom., 2019, Advance Article , DOI: 10.1039/C9JA00166B

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