Nanoscale thermal mapping of few-layer organic crystals
Abstract
Thermal stability and thermal management are critical to the performance of organic transistors/solar cells. However, these properties are rarely studied due to the limited techniques for measuring the thermal conduction of organic thin-film crystals. Using an active mode scanning thermal microscope (SThM), we quantitatively measured the thermal map of layered 1,4-bis(4-methylstyryl)benzene (BSB-Me) thin-film crystals. The out-of-plane thermal conductivity was calculated to be ∼0.15–0.20 W m−1 K−1 by comparing the temperature distributions of the thermal probe with the results of COMSOL Multiphysics simulations. This thickness-dependent SThM measurement provides important thermal-transport information of organic thin-film devices, where thermal dissipation is crucial.