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Issue 10, 2019
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Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging

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Abstract

The X-ray Birefringence Imaging (XBI) technique, first reported in 2014, is a sensitive method for spatially resolved mapping of the local orientational properties of anisotropic materials. We report the first application of the XBI technique to characterize molecular orientational ordering in a liquid crystalline material, demonstrating significant potential for exploiting XBI measurements to advance structural understanding of liquid crystal phases.

Graphical abstract: Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging

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Supplementary files

Article information


Submitted
27 Nov 2018
Accepted
21 Dec 2018
First published
02 Jan 2019

This article is Open Access
All publication charges for this article have been paid for by the Royal Society of Chemistry

Chem. Sci., 2019,10, 3005-3011
Article type
Edge Article

Spatially resolved mapping of phase transitions in liquid-crystalline materials by X-ray birefringence imaging

Y. Zhou, R. Patterson, B. A. Palmer, G. R. Edwards-Gau, Benson M. Kariuki, N. S. S. Kumar, D. W. Bruce, I. P. Dolbnya, S. P. Collins, A. Malandain and K. D. M. Harris, Chem. Sci., 2019, 10, 3005
DOI: 10.1039/C8SC05285A

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