Quantification of elements in copper–zinc ores at micro- and macro-levels by total reflection X-ray fluorescence and inductively coupled plasma atomic emission spectrometry†
A new approach for the direct determination of the elemental composition of sulfide and oxide copper–zinc ores in the solid state by total reflection X-ray fluorescence spectrometry (TXRF) is proposed. This approach based on the preparation of suspensions in high viscosity liquids without a sample digestion stage. Samples with different matrices, FeS2 and SiO2, are considered. The sample preparation issues are discussed in detail. The results obtained by TXRF are validated by a well-known analytical technique, inductively coupled plasma atomic emission spectrometry. It is shown that TXRF can be used for the quantification of the most important elements in copper–zinc ores: S, Fe, Cu, Zn and As.