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Issue 30, 2018
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High-throughput optical thickness and size characterization of 2D materials

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Abstract

We describe a method using simple optical microscopy and image processing that simultaneously characterizes thousands of nanosheets in a sample area on the order of 1 mm2. Including data acquisition and processing, both the number of atomic layers and the lateral sizes of all sheets can be obtained within a few hours—approximately 100 times faster than with previous methods, such as atomic force microscopy. This is achieved by normalizing the optical image based on substrate brightness, which eliminates inhomogeneities usually limiting optical techniques. Ultimately, the method enables robust statistical analysis of populations of nanosheet materials. We demonstrate the utility of this method by examining fractions made from a sample of graphene oxide (GO) made using an emulsion-based method. Beyond providing the morphological composition of the samples, the reported method is sensitive enough to provide information about the oxidation level of a population of GO sheets and, correspondingly, optical constants of the material.

Graphical abstract: High-throughput optical thickness and size characterization of 2D materials

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Publication details

The article was received on 01 Mar 2018, accepted on 10 Apr 2018 and first published on 04 May 2018


Article type: Paper
DOI: 10.1039/C8NR01725E
Citation: Nanoscale, 2018,10, 14441-14447
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    High-throughput optical thickness and size characterization of 2D materials

    W. W. Dickinson, H. V. Kumar, D. H. Adamson and H. C. Schniepp, Nanoscale, 2018, 10, 14441
    DOI: 10.1039/C8NR01725E

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