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Trends in valence band electronic structure of mixed uranium oxides

Abstract

Valence band electronic structure of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, b-UO3) has been studied by the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and by computational methods. We show here that the RIXS technique and recorded U 5f - O 2p charge transfer excitations can be used to proof the validity of theoretical approximations

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Publication details

The article was received on 06 Jul 2018, accepted on 07 Aug 2018 and first published on 08 Aug 2018


Article type: Communication
DOI: 10.1039/C8CC05464A
Citation: Chem. Commun., 2018, Accepted Manuscript
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    Trends in valence band electronic structure of mixed uranium oxides

    K. Kvashnina, P. Kowalski, S. M. Butorin, G. Leinders, J. Pakarinen, R. Bes, H. Li and M. Verwerft, Chem. Commun., 2018, Accepted Manuscript , DOI: 10.1039/C8CC05464A

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