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Issue 70, 2018
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Trends in the valence band electronic structures of mixed uranium oxides

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Abstract

The valence band electronic structures of mixed uranium oxides (UO2, U4O9, U3O7, U3O8, and β-UO3) have been studied using the resonant inelastic X-ray scattering (RIXS) technique at the U M5 edge and computational methods. We show here that the RIXS technique and recorded U 5f–O 2p charge transfer excitations can be used to test the validity of theoretical approximations.

Graphical abstract: Trends in the valence band electronic structures of mixed uranium oxides

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Publication details

The article was received on 06 Jul 2018, accepted on 07 Aug 2018 and first published on 08 Aug 2018


Article type: Communication
DOI: 10.1039/C8CC05464A
Citation: Chem. Commun., 2018,54, 9757-9760
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    Trends in the valence band electronic structures of mixed uranium oxides

    K. O. Kvashnina, P. M. Kowalski, S. M. Butorin, G. Leinders, J. Pakarinen, R. Bès, H. Li and M. Verwerft, Chem. Commun., 2018, 54, 9757
    DOI: 10.1039/C8CC05464A

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