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Issue 10, 2018
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Beam sampling: taking samples at the micro-scale

Abstract

When using a beam to make a measurement in situ, irrespective of scale, the process implicitly includes the taking of a sample. Therefore, the uncertainty of the measurement result needs to include the uncertainty generated by the sampling process, which is usually dominated by the heterogeneity of the analyte at that scale. Reliable estimates of the uncertainty of beam measurements are essential to judge their fitness-for-purpose (FFP) and hence to enable their rigorous interpretation. This approach can be applied to a wide range of techniques for the analytical assessments of materials, from handheld portable X-ray Fluorescence (pXRF) at the millimeter scale, to Secondary Ion Mass Spectrometry (SIMS) at the micron scale.

Graphical abstract: Beam sampling: taking samples at the micro-scale

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Article information


Submitted
07 Feb 2018
Accepted
07 Feb 2018
First published
27 Feb 2018

Anal. Methods, 2018,10, 1100-1102
Article type
AMC Technical Brief

Beam sampling: taking samples at the micro-scale

Analytical Methods Committee, AMCTB No. 84, Anal. Methods, 2018, 10, 1100
DOI: 10.1039/C8AY90021C

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