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Issue 20, 2018
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Dual conical shell illumination for volumetric high-energy X-ray diffraction imaging

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Abstract

To retrieve crystallographic information from extended sample volumes requires a high-energy probe. The use of X-rays to combine imaging with materials characterisation is well-established. However, if fundamental crystallographic parameters are required, then the collection and analysis of X-rays diffracted by the inspected samples are prerequisites. We present a new X-ray diffraction imaging architecture, which in comparison with previous depth-resolving hollow beam techniques requires significantly less X-ray power or alternatively supports significantly increased scanning speeds. Our conceptual configuration employs a pair of conical shell X-ray beams derived from a single point source to illuminate extended samples. Diffracted flux measurements would then be obtained using a pair of energy resolving point detectors. This dual beam configuration is tested using a single X-ray beam set-up employing a dual scan. The use of commercial off-the-shelf low-cost components has the potential to provide rapid and cost-effective performance in areas including industrial process control, medical imaging and explosives detection.

Graphical abstract: Dual conical shell illumination for volumetric high-energy X-ray diffraction imaging

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Publication details

The article was received on 09 Aug 2018, accepted on 13 Sep 2018 and first published on 13 Sep 2018


Article type: Communication
DOI: 10.1039/C8AN01537F
Citation: Analyst, 2018,143, 4849-4853
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    Dual conical shell illumination for volumetric high-energy X-ray diffraction imaging

    A. Dicken, D. Spence, K. Rogers, D. Prokopiou and P. Evans, Analyst, 2018, 143, 4849
    DOI: 10.1039/C8AN01537F

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