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Issue 53, 2017
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Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

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Abstract

Tip-enhanced Raman scattering (TERS) can be used to image plasmon-enhanced local electric field variations with extremely high spatial resolution under ambient conditions. This is illustrated through TERS images recorded using a silver atomic force microscope tip coated with strategically selected molecular reporters and used to image a sputtered silver film.

Graphical abstract: Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

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Supplementary files

Article information


Submitted
05 Apr 2017
Accepted
28 Apr 2017
First published
05 May 2017

Chem. Commun., 2017,53, 7310-7313
Article type
Communication

Imaging localized electric fields with nanometer precision through tip-enhanced Raman scattering

A. Bhattarai and P. Z. El-Khoury, Chem. Commun., 2017, 53, 7310
DOI: 10.1039/C7CC02593A

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