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Issue 43, 2017
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Lithography-free electrical transport measurements on 2D materials by direct microprobing

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Abstract

We present a method to carry out electrical and optoelectronic measurements on 2D materials using carbon fiber microprobes to directly make electrical contacts with the 2D materials without damaging them. The working principle of this microprobing method is illustrated by measuring transport in MoS2 flakes in vertical (transport in the out-of-plane direction) and lateral (transport within the crystal plane) configurations, finding performances comparable to those reported for MoS2 devices fabricated by the conventional lithographic process. We also show that this method can be used with other 2D materials.

Graphical abstract: Lithography-free electrical transport measurements on 2D materials by direct microprobing

  • This article is part of the themed collection: 2D Materials
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Supplementary files

Article information


Submitted
21 Mar 2017
Accepted
15 May 2017
First published
15 May 2017

J. Mater. Chem. C, 2017,5, 11252-11258
Article type
Paper

Lithography-free electrical transport measurements on 2D materials by direct microprobing

P. Gant, Y. Niu, S. A. Svatek, N. Agraït, C. Munuera, M. García-Hernández, R. Frisenda, D. P. de Lara and A. Castellanos-Gomez, J. Mater. Chem. C, 2017, 5, 11252
DOI: 10.1039/C7TC01203A

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