Issue 18, 2016

Rapid quantitative chemical mapping of surfaces with sub-2 nm resolution

Abstract

We present a theory that exploits four observables in bimodal atomic force microscopy to produce maps of the Hamaker constant H. The quantitative H maps may be employed by the broader community to directly interpret the high resolution of standard bimodal AFM images as chemical maps while simultaneously quantifying chemistry in the non-contact regime. We further provide a simple methodology to optimize a range of operational parameters for which H is in the closest agreement with the Lifshitz theory in order to (1) simplify data acquisition and (2) generalize the methodology to any set of cantilever–sample systems.

Graphical abstract: Rapid quantitative chemical mapping of surfaces with sub-2 nm resolution

Supplementary files

Article information

Article type
Paper
Submitted
19 Jan 2016
Accepted
07 Apr 2016
First published
08 Apr 2016

Nanoscale, 2016,8, 9688-9694

Rapid quantitative chemical mapping of surfaces with sub-2 nm resolution

C. Lai, S. Perri, S. Santos, R. Garcia and M. Chiesa, Nanoscale, 2016, 8, 9688 DOI: 10.1039/C6NR00496B

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements