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Issue 10, 2016
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Combined 1D, 2D and 3D micro-XRF techniques for the analysis of illuminated manuscripts

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Abstract

The combination of several micro-XRF analysis modes is presented for the investigation of an illuminated parchment manuscript. With a commercial instrument, conventional micro-XRF spot analysis (0D) and mapping (2D) are performed, yielding detailed lateral elemental information. Depth resolution becomes accessible by mounting an additional polycapillary lens in front of an SDD detector. Quantitative confocal depth profiles (1D) are presented as well as the full separation of the front and the backside decorations with the help of fast 3D mappings of specific areas. Only through the use of these multi-dimensional modes can elemental information be assigned both to lateral and depth positions, making the analysis of such heterogeneous samples feasible.

Graphical abstract: Combined 1D, 2D and 3D micro-XRF techniques for the analysis of illuminated manuscripts

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Publication details

The article was received on 16 Jun 2016, accepted on 25 Aug 2016 and first published on 25 Aug 2016


Article type: Paper
DOI: 10.1039/C6JA00220J
J. Anal. At. Spectrom., 2016,31, 1989-1997

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    Combined 1D, 2D and 3D micro-XRF techniques for the analysis of illuminated manuscripts

    T. Lachmann, G. van der Snickt, M. Haschke and I. Mantouvalou, J. Anal. At. Spectrom., 2016, 31, 1989
    DOI: 10.1039/C6JA00220J

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