Jump to main content
Jump to site search
Access to RSC content Close the message box

Continue to access RSC content when you are not at your institution. Follow our step-by-step guide.


Issue 48, 2015
Previous Article Next Article

Nanocrystal size distribution analysis from transmission electron microscopy images

Author affiliations

Abstract

We propose a method, with minimal bias caused by user input, to quickly detect and measure the nanocrystal size distribution from transmission electron microscopy (TEM) images using a combination of Laplacian of Gaussian filters and non-maximum suppression. We demonstrate the proposed method on bright-field TEM images of an a-SiC:H sample containing embedded silicon nanocrystals with varying magnifications and we compare the accuracy and speed with size distributions obtained by manual measurements, a thresholding method and PEBBLES. Finally, we analytically consider the error induced by slicing nanocrystals during TEM sample preparation on the measured nanocrystal size distribution and formulate an equation to correct this effect.

Graphical abstract: Nanocrystal size distribution analysis from transmission electron microscopy images

Back to tab navigation

Supplementary files

Article information


Submitted
12 Sep 2015
Accepted
06 Nov 2015
First published
10 Nov 2015

Nanoscale, 2015,7, 20593-20606
Article type
Paper
Author version available

Nanocrystal size distribution analysis from transmission electron microscopy images

M. van Sebille, L. J. P. van der Maaten, L. Xie, K. Jarolimek, R. Santbergen, R. A. C. M. M. van Swaaij, K. Leifer and M. Zeman, Nanoscale, 2015, 7, 20593
DOI: 10.1039/C5NR06292F

Social activity

Search articles by author

Spotlight

Advertisements