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Issue 4, 2014
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Tip-enhanced near-field optical microscopy

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Tip-enhanced near-field optical microscopy (TENOM) is a scanning probe technique capable of providing a broad range of spectroscopic information on single objects and structured surfaces at nanometer spatial resolution and with highest detection sensitivity. In this review, we first illustrate the physical principle of TENOM that utilizes the antenna function of a sharp probe to efficiently couple light to excitations on nanometer length scales. We then discuss the antenna-induced enhancement of different optical sample responses including Raman scattering, fluorescence, generation of photocurrent and electroluminescence. Different experimental realizations are presented and several recent examples that demonstrate the capabilities of the technique are reviewed.

Graphical abstract: Tip-enhanced near-field optical microscopy

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The article was received on 16 Jul 2013 and first published on 08 Oct 2013

Article type: Review Article
DOI: 10.1039/C3CS60258C
Chem. Soc. Rev., 2014,43, 1248-1262

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    Tip-enhanced near-field optical microscopy

    N. Mauser and A. Hartschuh, Chem. Soc. Rev., 2014, 43, 1248
    DOI: 10.1039/C3CS60258C

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