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Issue 46, 2014
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The temperature-dependent microstructure of PEDOT/PSS films: insights from morphological, mechanical and electrical analyses

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Abstract

Poly(3,4-ethylenedioxythiophene)/poly(styrenesulfonate) (PEDOT/PSS) is a widely used conductive polymer in the field of flexible electronics. The ways its microstructure changes over a broad range of temperatures remain unclear. This paper describes microstructure changes at different temperatures and correlates the microstructure with its physical properties (mechanical and electrical). We used High-Angle Annular Dark-Field Scanning Electron Microscopy (HAADF-STEM) combined with electron energy loss spectroscopy (EELS) to determine the morphology and elemental atomic ratio of the film at different temperatures. These results together with the Atomic Force Microscopy (AFM) analysis provide the foundation for a model of how the temperature affects the microstructure of PEDOT/PSS. Moreover, dynamic mechanical analysis (DMA) and electrical characterization were performed to analyze the microstructure and physical property correlations.

Graphical abstract: The temperature-dependent microstructure of PEDOT/PSS films: insights from morphological, mechanical and electrical analyses

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Supplementary files

Article information


Submitted
21 Jul 2014
Accepted
24 Sep 2014
First published
24 Sep 2014

J. Mater. Chem. C, 2014,2, 9903-9910
Article type
Paper
Author version available

The temperature-dependent microstructure of PEDOT/PSS films: insights from morphological, mechanical and electrical analyses

J. Zhou, D. H. Anjum, L. Chen, X. Xu, I. A. Ventura, L. Jiang and G. Lubineau, J. Mater. Chem. C, 2014, 2, 9903
DOI: 10.1039/C4TC01593B

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