Robust thin-film fluorescence thermometry for prolonged measurements in microfluidic devices†
Abstract
This work presents a robust method for whole chip temperature mapping in microfluidic devices using a photostable fluorescent-
* Corresponding authors
a
Department of Physics and Astronomy, and Guelph-Waterloo Physics Institute, University of Waterloo, 200 University Ave W., Waterloo, ON, Canada
E-mail:
jforrest@uwaterloo.ca
Fax: (519) 888-4567
Tel: (519) 888-4567 x32161
b
Department of Mechanical and Mechatronics Engineering, University of Waterloo, 200 University Ave W., Waterloo, ON, Canada
E-mail:
c3ren@uwaterloo.ca
Fax: (519) 885-5862
Tel: (519) 888-4567 x33030
This work presents a robust method for whole chip temperature mapping in microfluidic devices using a photostable fluorescent-
K. M. Schreiter, T. Glawdel, J. A. Forrest and C. L. Ren, RSC Adv., 2013, 3, 17236 DOI: 10.1039/C3RA41368C
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