Issue 11, 2013

Electrically driven ultraviolet random lasing from an n-MgZnO/i-ZnO/SiO2/p-Si asymmetric double heterojunction

Abstract

Electrically pumped lasing action has been realized in ZnO from an n-MgZnO/i-ZnO/SiO2/p-Si asymmetric double heterostructure, an ultralow threshold of 3.9 mA was obtained. The mechanism of the laser is associated with the in-plane random resonator cavities formed in the ZnO films and the elaborate hollow-shaped SiO2 cladding pattern, which prevent the lateral diffusion of injection current and ultimately lower the threshold current of the laser diode. In addition, a waveguide mechanism due to different refractive indices of three epilayers enhances the guided optical field on the ZnO side, resulting in an improved light extraction efficiency.

Graphical abstract: Electrically driven ultraviolet random lasing from an n-MgZnO/i-ZnO/SiO2/p-Si asymmetric double heterojunction

Article information

Article type
Paper
Submitted
02 Nov 2012
Accepted
05 Apr 2013
First published
10 Apr 2013

Nanoscale, 2013,5, 5080-5085

Electrically driven ultraviolet random lasing from an n-MgZnO/i-ZnO/SiO2/p-Si asymmetric double heterojunction

Z. Shi, Y. Zhang, X. Xia, W. Zhao, H. Wang, L. Zhao, X. Dong, B. Zhang and G. Du, Nanoscale, 2013, 5, 5080 DOI: 10.1039/C3NR33445G

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