Issue 19, 2013

Cyclic twinning and internal defects of boron-rich nanowires revealed by three-dimensional electron diffraction mapping

Abstract

Structural characterization of individual nanosized boron-rich nanowires has been carried out through analysing the three-dimensional (3D) electron diffraction intensity distribution. Not only can the cyclic twinning structure of these nanowires be easily determined, the new approach also reveals the heterogeneous strain relaxation within the intact nanowire, through the accurate determination of the orientation relationship between the constituent crystallites. The quantitative analysis of the fine structure in the 3D diffraction dataset indicates that this may be related to the distribution of defects such as stacking faults, microtwins and dislocations. It is envisaged that the non-destructive nature of this approach could open the way for the in situ study of the structural evolution of complex nanomaterials and polycrystalline materials in general.

Graphical abstract: Cyclic twinning and internal defects of boron-rich nanowires revealed by three-dimensional electron diffraction mapping

Supplementary files

Article information

Article type
Paper
Submitted
12 Apr 2013
Accepted
01 Jul 2013
First published
05 Jul 2013
This article is Open Access
Creative Commons BY license

Nanoscale, 2013,5, 9067-9072

Cyclic twinning and internal defects of boron-rich nanowires revealed by three-dimensional electron diffraction mapping

X. Fu and J. Yuan, Nanoscale, 2013, 5, 9067 DOI: 10.1039/C3NR01839C

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