High sensitivity piezomagnetic force microscopy for quantitative probing of magnetic materials at the nanoscale†
Abstract
Accurate scanning probing of magnetic materials at the nanoscale is essential for developing and characterizing magnetic
* Corresponding authors
a
Department of Mechanical Engineering, University of Washington, Seattle, WA 98195-2600, USA
E-mail:
jjli@u.washington.edu
b Faculty of Materials, Optoelectronics and Physics, and Key Laboratory of Low Dimensional Materials & Application Technology of Ministry of Education, Xiangtan University, Xiangtan, Hunan 411105, China
c Asylum Research, 6310 Hollister Ave., Santa Barbara, CA 93117, USA
Accurate scanning probing of magnetic materials at the nanoscale is essential for developing and characterizing magnetic
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