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Issue 19, 2013
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Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

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Abstract

Fabrication of modern nanomaterials and nanostructures with specific functional properties is both scientifically promising and commercially profitable. The preparation and use of nanomaterials require adequate methods for the control and characterization of their size, shape, chemical composition, crystalline structure, energy levels, pathways and dynamics of physical and chemical processes during their fabrication and further use. In this review, we discuss different instrumental methods for the analysis and metrology of materials and evaluate their advantages and limitations at the nanolevel.

Graphical abstract: Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

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Article information


Submitted
08 May 2013
Accepted
12 Jul 2013
First published
16 Jul 2013

Nanoscale, 2013,5, 8781-8798
Article type
Review Article

Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

P. Linkov, M. Artemyev, A. E. Efimov and I. Nabiev, Nanoscale, 2013, 5, 8781
DOI: 10.1039/C3NR02372A

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