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Issue 19, 2013
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Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

Pavel Linkov,a   Mikhail Artemyev,ab   Anton E. Efimovcd  and  Igor Nabiev*aef  
Author affiliations

* Corresponding authors

a Laboratory of Nano-Bioengineering, National Research Nuclear University, Moscow Engineering Physics Institute, 31 Kashirskoe sh., 115409 Moscow, Russian Federation
E-mail: igor.nabiev@gmail.com
Web: http://www.lnbe.mephi.ru

b Institute for Physico-Chemical Problems, Belarusian State University, 220050 Minsk, Belarus

c Laboratory of Bionanotechnology, Shumakov Federal Research Center of Transplantology and Artificial Organs, Moscow, Russian Federation

d SNOTRA LLC, Moscow, Russian Federation

e European Technological Platform Semiconductor Nanocrystals, Institute of Molecular Medicine, Trinity College Dublin, James's Street, Dublin 8, Ireland

f Laboratory of Research in Nanosciences – EA4682, Université de Reims Champagne-Ardenne, 51100 Reims, France

Abstract

Fabrication of modern nanomaterials and nanostructures with specific functional properties is both scientifically promising and commercially profitable. The preparation and use of nanomaterials require adequate methods for the control and characterization of their size, shape, chemical composition, crystalline structure, energy levels, pathways and dynamics of physical and chemical processes during their fabrication and further use. In this review, we discuss different instrumental methods for the analysis and metrology of materials and evaluate their advantages and limitations at the nanolevel.

Graphical abstract: Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

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Article information

Submitted
08 May 2013
Accepted
12 Jul 2013
First published
16 Jul 2013
Nanoscale, 2013,5, 8781-8798
Article type
Review Article
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Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

P. Linkov, M. Artemyev, A. E. Efimov and I. Nabiev, Nanoscale, 2013, 5, 8781
DOI: 10.1039/C3NR02372A

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