Jump to main content
Jump to site search
Publishing
Advanced
Access to RSC content Close the message box

Continue to access RSC content when you are not at your institution. Follow our step-by-step guide.


Issue 19, 2013
Previous Article Next Article

Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

Pavel Linkov,a   Mikhail Artemyev,ab   Anton E. Efimovcd  and  Igor Nabiev*aef  
Author affiliations

* Corresponding authors

a Laboratory of Nano-Bioengineering, National Research Nuclear University, Moscow Engineering Physics Institute, 31 Kashirskoe sh., 115409 Moscow, Russian Federation
E-mail: igor.nabiev@gmail.com
Web: http://www.lnbe.mephi.ru

b Institute for Physico-Chemical Problems, Belarusian State University, 220050 Minsk, Belarus

c Laboratory of Bionanotechnology, Shumakov Federal Research Center of Transplantology and Artificial Organs, Moscow, Russian Federation

d SNOTRA LLC, Moscow, Russian Federation

e European Technological Platform Semiconductor Nanocrystals, Institute of Molecular Medicine, Trinity College Dublin, James's Street, Dublin 8, Ireland

f Laboratory of Research in Nanosciences – EA4682, Université de Reims Champagne-Ardenne, 51100 Reims, France

Abstract

Fabrication of modern nanomaterials and nanostructures with specific functional properties is both scientifically promising and commercially profitable. The preparation and use of nanomaterials require adequate methods for the control and characterization of their size, shape, chemical composition, crystalline structure, energy levels, pathways and dynamics of physical and chemical processes during their fabrication and further use. In this review, we discuss different instrumental methods for the analysis and metrology of materials and evaluate their advantages and limitations at the nanolevel.

Graphical abstract: Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

Back to tab navigation
Download options Please wait...

Article information

https://doi.org/10.1039/C3NR02372A
Submitted
08 May 2013
Accepted
12 Jul 2013
First published
16 Jul 2013
Nanoscale, 2013,5, 8781-8798
Article type
Review Article
Permissions
Request permissions

Comparative advantages and limitations of the basic metrology methods applied to the characterization of nanomaterials

P. Linkov, M. Artemyev, A. E. Efimov and I. Nabiev, Nanoscale, 2013, 5, 8781
DOI: 10.1039/C3NR02372A

If you are not the author of this article and you wish to reproduce material from it in a third party non-RSC publication you must formally request permission using Copyright Clearance Center. Go to our Instructions for using Copyright Clearance Center page for details.

Authors contributing to RSC publications (journal articles, books or book chapters) do not need to formally request permission to reproduce material contained in this article provided that the correct acknowledgement is given with the reproduced material.

Reproduced material should be attributed as follows:

  • For reproduction of material from NJC:
    Reproduced from Ref. XX with permission from the Centre National de la Recherche Scientifique (CNRS) and The Royal Society of Chemistry.
  • For reproduction of material from PCCP:
    Reproduced from Ref. XX with permission from the PCCP Owner Societies.
  • For reproduction of material from PPS:
    Reproduced from Ref. XX with permission from the European Society for Photobiology, the European Photochemistry Association, and The Royal Society of Chemistry.
  • For reproduction of material from all other RSC journals and books:
    Reproduced from Ref. XX with permission from The Royal Society of Chemistry.

If the material has been adapted instead of reproduced from the original RSC publication "Reproduced from" can be substituted with "Adapted from".

In all cases the Ref. XX is the XXth reference in the list of references.

If you are the author of this article you do not need to formally request permission to reproduce figures, diagrams etc. contained in this article in third party publications or in a thesis or dissertation provided that the correct acknowledgement is given with the reproduced material.

Reproduced material should be attributed as follows:

  • For reproduction of material from NJC:
    [Original citation] - Reproduced by permission of The Royal Society of Chemistry (RSC) on behalf of the Centre National de la Recherche Scientifique (CNRS) and the RSC
  • For reproduction of material from PCCP:
    [Original citation] - Reproduced by permission of the PCCP Owner Societies
  • For reproduction of material from PPS:
    [Original citation] - Reproduced by permission of The Royal Society of Chemistry (RSC) on behalf of the European Society for Photobiology, the European Photochemistry Association, and RSC
  • For reproduction of material from all other RSC journals:
    [Original citation] - Reproduced by permission of The Royal Society of Chemistry

If you are the author of this article you still need to obtain permission to reproduce the whole article in a third party publication with the exception of reproduction of the whole article in a thesis or dissertation.

Information about reproducing material from RSC articles with different licences is available on our Permission Requests page.

Social activity

Search articles by author

Spotlight

Advertisements