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Issue 34, 2013
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Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

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Abstract

Several techniques can be applied to characterize redox properties of wide bandgap semiconductors, however some of them are of limited use. In this paper we propose a new modification of the old spectroelectrochemical method developed two decades ago. A procedure based on measurements of the reflectance changes as a function of potential applied to the electrode coated with the studied material appears to be a very convenient tool for characterizing redox properties of semiconductors, forming either transparent or opaque films at a platinum electrode. A discussion on the measured redox parameters of semiconductor films concludes with a definition of a new term, the absorption onset potential of the material.

Graphical abstract: Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

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Article information


Submitted
20 May 2013
Accepted
03 Jul 2013
First published
04 Jul 2013

Phys. Chem. Chem. Phys., 2013,15, 14256-14261
Article type
Paper

Redox characterization of semiconductors based on electrochemical measurements combined with UV-Vis diffuse reflectance spectroscopy

E. Świętek, K. Pilarczyk, J. Derdzińska, K. Szaciłowski and W. Macyk, Phys. Chem. Chem. Phys., 2013, 15, 14256
DOI: 10.1039/C3CP52129J

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