Issue 1, 2013

Optical detection of single nano-objects by transient absorption microscopy

Abstract

In recent years there has been considerable effort in developing ultra-sensitive imaging techniques based on absorption. This mini-review describes recent results from our laboratory on detecting single nano-objects using transient absorption microscopy. This technique is extremely flexible, allowing the detection of single semiconductor and metal nanostructures with high sensitivity. The goal of this review is to illustrate key points in implementing transient absorption microscopy for ultra-sensitive detection, as well as to discuss the advantages and disadvantages of this technique compared to other optical absorption based methods.

Graphical abstract: Optical detection of single nano-objects by transient absorption microscopy

Supplementary files

Article information

Article type
Minireview
Submitted
09 Aug 2012
Accepted
15 Oct 2012
First published
19 Oct 2012

Analyst, 2013,138, 25-31

Optical detection of single nano-objects by transient absorption microscopy

S. S. Lo, M. S. Devadas, T. A. Major and G. V. Hartland, Analyst, 2013, 138, 25 DOI: 10.1039/C2AN36097G

To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.

If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.

If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.

Read more about how to correctly acknowledge RSC content.

Social activity

Spotlight

Advertisements