Electron holography characterization as a method for measurements of diameter and mean inner potential of hollow nanomaterials
Abstract
In this paper, we provide a method for the simultaneous measurement of the inner diameter of
* Corresponding authors
a
Beijing National Laboratory for Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China
E-mail:
rcyu@aphy.iphy.ac.cn
Fax: +86-10-82649531
Tel: +86-10-82649159
b Key Laboratory of Rubber-plastics, Ministry of Education, School of Polymer Science and Engineering, Qingdao University of Science and Technology, Qingdao 266042, P.R. China
In this paper, we provide a method for the simultaneous measurement of the inner diameter of
Y. Yang, N. Niu, C. Li, Y. Yao, G. Piao and R. Yu, Nanoscale, 2012, 4, 7460 DOI: 10.1039/C2NR31704D
To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.
If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.
If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.
Read more about how to correctly acknowledge RSC content.
Fetching data from CrossRef.
This may take some time to load.
Loading related content