Energetics and dynamics of a new type of extended line defects in graphene
Abstract
We revealed a novel extended line defect (ELD) containing tetragonal rings embedded in
* Corresponding authors
a
Department of Physics and Materials Science, City University of Hong Kong, Hong Kong SAR, China
E-mail:
aprqz@cityu.edu.hk, vanhove@cityu.edu.hk
b
Department of Physics, University of Science and Technology of China, Hefei, China
E-mail:
zjlin@ustc.edu.cn
c USTC-CityU Joint Advanced Research Centre, Suzhou, China
We revealed a novel extended line defect (ELD) containing tetragonal rings embedded in
Y. Li, R. Zhang, Z. Lin and M. A. Van Hove, Nanoscale, 2012, 4, 2580 DOI: 10.1039/C2NR30185G
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