Cu Kβ2,5 X-ray emission spectroscopy as a tool for characterization of monovalent copper compounds

J. R. Vegelius; K. O. Kvashnina; M. Klintenberg; I. L. Soroka; S. M. Butorin

doi:10.1039/C2JA30095H

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Cu Kβ_2,5X-ray emission spectroscopy as a tool for characterization of monovalent copper compounds

J. R. Vegelius,^a K. O. Kvashnina,^b M. Klintenberg,^a I. L. Soroka^c and S. M. Butorin*^a

Author affiliations

* Corresponding authors

^a Department of Physics and Astronomy, Uppsala University, Box 516, S-751 20 Uppsala, Sweden
E-mail: sergei.butorin@physics.uu.se

^b ID26, European Synchrotron Radiation Facility, BP220, Grenoble Cedex, France

^c Nuclear Chemistry, KTH Chemical Science and Engineering, Royal Institute of Technology, SE-100 44 Stockholm, Sweden

Abstract

Cu Kβ_2,5 X-ray emission and resonant inelastic X-ray scattering measurements were performed on monovalent and divalent copper compounds. The data were compared with the results of local-density-approximation calculations. The methods were found to be efficient tools for studies of Cu 4p states in the valence band and for distinguishing between different monovalent copper compounds. This is of particular importance for the debate concerning copper corrosion in oxygen-free water.

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Article information

DOI: https://doi.org/10.1039/C2JA30095H
Article type: Paper
Submitted: 15 Mar 2012
Accepted: 07 Aug 2012
First published: 22 Aug 2012

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J. Anal. At. Spectrom., 2012,27, 1882-1888

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Cu Kβ_2,5 X-ray emission spectroscopy as a tool for characterization of monovalent copper compounds

J. R. Vegelius, K. O. Kvashnina, M. Klintenberg, I. L. Soroka and S. M. Butorin, J. Anal. At. Spectrom., 2012, 27, 1882 DOI: 10.1039/C2JA30095H

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Journal of Analytical Atomic Spectrometry