Automated correlation and classification of secondary ion mass spectrometry images using a k-means cluster method†
Abstract
We present a novel method for correlating and classifying ion-specific
* Corresponding authors
a
Surface and Microanalysis Science Division, National Institute of Standards and Technology, Gaithersburg, MD, USA
E-mail:
cszakal@nist.gov
Fax: +1 301 417 1321
Tel: +1 301 975 3816
We present a novel method for correlating and classifying ion-specific
A. R. Konicek, J. Lefman and C. Szakal, Analyst, 2012, 137, 3479 DOI: 10.1039/C2AN16122B
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