Jump to main content
Jump to site search
Access to RSC content Close the message box

Continue to access RSC content when you are not at your institution. Follow our step-by-step guide.


Issue 5, 2012
Previous Article Next Article

Exciton diffusion length in narrow bandgap polymers

Author affiliations

Abstract

We developed a new method to accurately extract the singlet exciton diffusion length in organic semiconductors by blending them with a low concentration of methanofullerene[6,6]-phenyl-C61-butyric acid methyl ester (PCBM). The dependence of photoluminescence (PL) decay time on the fullerene concentration provides information on both exciton diffusion and the nanocomposition of the blend. Experimentally measured PL decays of blends based on two narrow band gap dithiophene–benzothiadiazole polymers, C–PCPDTBT and Si–PCPDTBT, were modeled using a Monte Carlo simulation of 3D exciton diffusion in the blend. The simulation software is available for download. The extracted exciton diffusion length is 10.5 ± 1 nm in both narrow band gap polymers, being considerably longer than the 5.4 ± 0.7 nm that was measured with the same technique in the model compound poly(3-hexylthiophene) as a reference. Our approach is simple, fast and allows us to systematically measure and compare exciton diffusion length in a large number of compounds.

Graphical abstract: Exciton diffusion length in narrow bandgap polymers

Back to tab navigation

Article information


Submitted
14 Dec 2011
Accepted
10 Feb 2012
First published
10 Feb 2012

Energy Environ. Sci., 2012,5, 6960-6965
Article type
Paper

Exciton diffusion length in narrow bandgap polymers

O. V. Mikhnenko, H. Azimi, M. Scharber, M. Morana, P. W. M. Blom and M. A. Loi, Energy Environ. Sci., 2012, 5, 6960
DOI: 10.1039/C2EE03466B

Social activity

Search articles by author

Spotlight

Advertisements