Rapid assessment of the stability of DNA duplexes by impedimetric real-time monitoring of chemically induced denaturation†
Abstract
In this article, we report on the electronic monitoring of DNA denaturation by
* Corresponding authors
a
Hasselt University, Institute for Materials Research, Wetenschapspark 1, Diepenbeek, Belgium
E-mail:
bart.vangrinsven@uhasselt.be
b Hasselt University, Biomedical Research Institute, Agoralaan, Diepenbeek, Belgium
c IMEC vzw—Division IMOMEC, Wetenschapspark 1, Diepenbeek, Belgium
d University of Applied Sciences Kaiserslautern, Department of Informatics and Microsystems Technology, Amerikastrasse 1, Zweibrücken, Germany
e Aachen University of Applied Sciences, Institute for Nano- and Biotechnologies, Ginsterweg 1, Jülich, Germany
f XIOS University College Limburg, Department of Electronic Engineering, Agoralaan Building H, Diepenbeek, Belgium
In this article, we report on the electronic monitoring of DNA denaturation by
B. van Grinsven, N. Vanden Bon, L. Grieten, M. Murib, S. D. Janssens, K. Haenen, E. Schneider, S. Ingebrandt, M. J. Schöning, V. Vermeeren, M. Ameloot, L. Michiels, R. Thoelen, W. De Ceuninck and P. Wagner, Lab Chip, 2011, 11, 1656 DOI: 10.1039/C1LC20027E
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