Thermal phase transformation of In2Se3 nanowires studied by in situsynchrotron radiation X-ray diffraction

Yang Li; Jing Gao; Qinliang Li; Mingfa Peng; Xuhui Sun; Youyong Li; Gang Yuan; Wen Wen; M. Meyyappan

doi:10.1039/C1JM10419E

Thermal phase transformation of In₂Se₃nanowires studied by in situsynchrotron radiation X-ray diffraction†

Yang Li,^a Jing Gao,^a Qinliang Li,^a Mingfa Peng,^a Xuhui Sun,*^a Youyong Li,*^a Gang Yuan,^b Wen Wen^b and M. Meyyappan^cd

Author affiliations

* Corresponding authors

^a Institute of Functional Nano & Soft Materials (FUNSOM) and Jiangsu Key Laboratory for Carbon Based Materials and Devices, Soochow University, Suzhou, Jiangsu, People's Republic of China
E-mail: xhsun@suda.edu.cn, yyli@suda.edu.cn

^b Shanghai Synchrotron Radiation Facility, Shanghai Institute of Applied Physics, Chinese Academy of Sciences, Shanghai, P. R. China

^c NASA Ames Research Center, Moffett Field, CA, USA

^d Division of IT Convergence Engineering, Pohang University of Science and Technology, Pohang, S. Korea

Abstract

We report the preparation of α- and κ-phase In₂Se₃ nanowires by thermal evaporation and investigation of their phase transformations in situ by synchrotron radiation X-ray diffraction (XRD) during a thermal annealing process. The κ-phase transformed into the α-phase at 500 °C and eventually transformed to high temperature α-phase with a layered structure of 5 atoms-5 atoms at 700 °C irreversibly. Different atomistic structures of In₂Se₃ were modeled and optimized by DFT, which correlate well with the XRD results. The In₂Se₃ nanowires also exhibit a large difference in resistivity before and after annealing.

$Graphical abstract: Thermal phase transformation of In2Se3 nanowires studied by in situsynchrotron radiation X-ray diffraction$

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Article information

DOI: https://doi.org/10.1039/C1JM10419E
Article type: Paper
Submitted: 27 Jan 2011
Accepted: 11 Mar 2011
First published: 11 Apr 2011

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J. Mater. Chem., 2011,21, 6944-6947

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Thermal phase transformation of In₂Se₃ nanowires studied by in situsynchrotron radiation X-ray diffraction

Y. Li, J. Gao, Q. Li, M. Peng, X. Sun, Y. Li, G. Yuan, W. Wen and M. Meyyappan, J. Mater. Chem., 2011, 21, 6944 DOI: 10.1039/C1JM10419E

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