Electric field-induced nanopatterning of reduced graphene oxide on Si and a p–n diode junction†
Abstract
Electric field-induced (EFI)
* Corresponding authors
a
NCRI, Center for Smart Molecular Memory, Department of Chemistry, Sungkyunkwan University, Suwon, Korea
E-mail:
hyoyoung@skku.edu
Fax: +82 31 290 5934
Tel: +82 31 299 4566
b Department of Chemistry, Sungkyunkwan University, Suwon, Korea
Electric field-induced (EFI)
S. Seo, C. Jin, Y. R. Jang, J. Lee, S. K. Kim and H. Lee, J. Mater. Chem., 2011, 21, 5805 DOI: 10.1039/C0JM03939J
To request permission to reproduce material from this article, please go to the Copyright Clearance Center request page.
If you are an author contributing to an RSC publication, you do not need to request permission provided correct acknowledgement is given.
If you are the author of this article, you do not need to request permission to reproduce figures and diagrams provided correct acknowledgement is given. If you want to reproduce the whole article in a third-party publication (excluding your thesis/dissertation for which permission is not required) please go to the Copyright Clearance Center request page.
Read more about how to correctly acknowledge RSC content.
Fetching data from CrossRef.
This may take some time to load.
Loading related content