On the behavior of Ag nanowires under high temperature: in situ characterization by aberration-corrected STEM†
Abstract
Single crystal
* Corresponding authors
a
Department of Physics and Astronomy, The University of Texas at San Antonio, One UTSA Circle, San Antonio, TX, USA
E-mail:
miguel.yacaman@utsa.edu
b High Temperature Materials Laboratory, Microscopy Group, Materials Science and Technology Division, Oak Ridge National Laboratory, 1 Bethel Valley Road PO Box 2008, Oak Ridge, TN, USA
c The University of Texas at Austin, Microelectronics Research Center, 10100 Burnet Road, MER 1.606J/R9900, Austin, TX, USA
Single crystal
A. Mayoral, L. F. Allard, D. Ferrer, R. Esparza and M. Jose-Yacaman, J. Mater. Chem., 2011, 21, 893 DOI: 10.1039/C0JM02624G
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