Issue 3, 2011
From the journal:

Journal of Analytical Atomic Spectrometry

A routine procedure for the characterisation of polycapillary X-ray semi-lenses in parallelising mode with SEM/EDS

Vanessa Rackwitz,*a   Mathias Procop,b   Semfira Bjeoumikhova,b   Ulrich Panneac  and  Vasile-Dan Hodoroabaa  

* Corresponding authors

a BAM Federal Institute for Materials Research and Testing, Berlin, Germany
E-mail: vanessa.rackwitz@bam.de
Fax: +49 30 8104 1827
Tel: +49 30 8104 3144

b IFG Institute for Scientific Instruments GmbH, Rudower Chaussee 29/31, Berlin, Germany
E-mail: info@ifg-adlershof.de
Fax: +49 30 6392 6501
Tel: +49 30 6392 6500

c Humboldt-Universität zu Berlin, Unter den Linden 6, Berlin, Germany
E-mail: ulrich.panne@bam.de
Fax: +49 30 8104 1107
Tel: +49 30 8104 1100

Abstract

The accurate knowledge of the properties of polycapillary X-ray semi-lenses has a significant influence on the quantitative results in a widespread field of applications involving microfocus X-ray beams. A routine procedure for the characterisation of a polycapillary X-ray semi-lens with a scanning electron microscope (SEM) having attached an energy dispersive spectrometer (EDS) is presented in this paper. A key issue of the procedure consists of fitting the semi-lens in front of the EDS for spectra acquisition. Relevant semi-lens parameters such as focal distance, full width at half maximum (FWHM) of the acceptance area, and transmission are determined in parallelising mode of the semi-lens. Special attention has been paid to the calculation of the transmission.

Graphical abstract: A routine procedure for the characterisation of polycapillary X-ray semi-lenses in parallelising mode with SEM/EDS

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Article information

DOI
https://doi.org/10.1039/C0JA00135J
Article type
Paper
Submitted
25 Aug 2010
Accepted
09 Nov 2010
First published
13 Dec 2010

J. Anal. At. Spectrom., 2011,26, 499-504

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A routine procedure for the characterisation of polycapillary X-ray semi-lenses in parallelising mode with SEM/EDS

V. Rackwitz, M. Procop, S. Bjeoumikhova, U. Panne and V. Hodoroaba, J. Anal. At. Spectrom., 2011, 26, 499 DOI: 10.1039/C0JA00135J

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