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Issue 8, 2011
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Localization imaging using blinking quantum dots

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Abstract

The blinking phenomena of the quantum dots have been utilized in the super-resolution localization microscopy to map out the locations of individual quantum dots on a total internal reflection microscope. Our result indicated that the reconstructed image of quantum dots agreed with the topographic image measured by atomic force microscopy. Because of the superior optical properties of the quantum dots, the high localization resolution can be achieved in the shorter acquisition time with larger detected photon numbers. When the cells were labeled with quantum dots, the sub-cellular structures could be clearly seen in the reconstructed images taken by a commercial microscope without using complicated optical systems, special photo-switchable dye pairs or photo-activated fluorescence proteins.

Graphical abstract: Localization imaging using blinking quantum dots

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Publication details

The article was received on 03 Nov 2010, accepted on 08 Feb 2011 and first published on 28 Feb 2011


Article type: Paper
DOI: 10.1039/C0AN00859A
Citation: Analyst, 2011,136, 1608-1613

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    Localization imaging using blinking quantum dots

    F. Chien, C. W. Kuo and P. Chen, Analyst, 2011, 136, 1608
    DOI: 10.1039/C0AN00859A

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