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Issue 3, 2011
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Quantitative analysis of parallel nanowire array assembly by dielectrophoresis

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Abstract

We describe an assembly technique useful for generating ordered arrays of nanowires (NWs) between electrodesviadielectrophoresis (DEP) and an analysis technique useful for extracting quantitative information about the local electric fields and dielectrophoretic forces from video microscopy data. By tuning the magnitude of the applied electric fields such that the attractive forces on the NWs are of the same order of magnitude as the Brownian forces, and by taking advantage of the inter-NW repulsive forces during DEP, NWs can be assembled into parallel arrays with high reproducibility. By employing a particle-tracking code and analysis of NW motion, we demonstrate a method for quantitative mapping of the dielectrophoretic torques and NW–surface interactions as a function of position on the substrate, which allows a more complete understanding of the dynamics of the assembly and the ability to control these parameters for precise assembly.

Graphical abstract: Quantitative analysis of parallel nanowire array assembly by dielectrophoresis

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Article information


Submitted
26 Jul 2010
Accepted
21 Oct 2010
First published
16 Dec 2010

Nanoscale, 2011,3, 1059-1065
Article type
Paper

Quantitative analysis of parallel nanowire array assembly by dielectrophoresis

S. J. Papadakis, J. A. Hoffmann, D. Deglau, A. Chen, P. Tyagi and D. H. Gracias, Nanoscale, 2011, 3, 1059
DOI: 10.1039/C0NR00536C

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