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Issue 26, 2011
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Dissociative electron attachment to gas-phase formamide

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Dissociative electron attachment (DEA) to gaseous formamide, HCONH2, has been investigated in the energy range between 0 eV and 18 eV using a crossed electron/molecule beam technique. The negative ion fragments have been comprehensively monitored and assigned to molecular structures by comparison with the results for two differently deuterated derivatives, namely 1D-formamide, DCONH2, and N,N,D-formamide, HCOND2. The following products were observed: HCONH, CONH2, HCON, OCN, HCNH, CN, NH2/O, NH, and H. NH2 was also separated from O by using high-resolution negative ion mass spectrometry. Four resonant dissociation channels can be resolved, the strongest ones being located between 2.0 and 2.7 eV and between 6.0 and 7.0 eV. CN as the most abundant fragment and HCONH are the dominant products of the first of these two resonances. The most important products of the latter resonance are NH2, CN, H, CONH2, and OCN. It is thus found that the loss of neutral H is a site-selective process, dissociation from the N site taking place between 2.0 and 2.7 eV while dissociation from the C site occurs between 6.0 and 7.0 eV. The suitability of these reactions and thus of formamide as an agent for electron-induced surface functionalisation is discussed.

Graphical abstract: Dissociative electron attachment to gas-phase formamide

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Publication details

The article was received on 20 Mar 2011, accepted on 05 May 2011 and first published on 06 Jun 2011

Article type: Paper
DOI: 10.1039/C1CP20833K
Phys. Chem. Chem. Phys., 2011,13, 12305-12313

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    Dissociative electron attachment to gas-phase formamide

    T. Hamann, A. Edtbauer, F. Ferreira da Silva, S. Denifl, P. Scheier and P. Swiderek, Phys. Chem. Chem. Phys., 2011, 13, 12305
    DOI: 10.1039/C1CP20833K

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