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Issue 32, 2011
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Crystal growth of para-sexiphenyl on clean and oxygen reconstructed Cu(110) surfaces

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Abstract

The formation of crystalline para-sexiphenyl (6P) films on Cu(110) and Cu(110)–(2 × 1)O (Cu–O) has been studied by low energy electron diffraction, X-ray absorption spectroscopy and both in situ and ex situX-ray diffraction methods to elucidate the transition from the initial monolayers to crystalline thin films. It is found that, for Cu–O, a single and, for Cu(110), a double wetting layer is formed which then acts as a template for the subsequent 3D crystal growth. For both substrates the orientation of the long molecular axes of the 6P molecules in the first layers is conserved for the molecules in the bulk crystals growing on them. The main difference between both systems is that on Cu–O the first monolayer assembles in a form close to that of a 6P bulk plane which can be easily continued by crystallites grown upon them, while on the Cu(110) surface the 6P mono- and bi-layers differ substantially from the bulk structure. The bi-layer forms a complex periodically striped phase. Thin 6P films grow with the 6P(20[3 with combining macron]) crystal plane parallel to the Cu–O substrate surface. For this orientation, the 6P molecules are stacked in layers and the molecules demonstrate only one tilt of the mean molecular plane with respect to the sample surface. On clean Cu(110), a more complex 6P([6 with combining macron]29) plane is parallel to the substrate surface and this orientation is likely a consequence of the super-molecular long-range periodicity of the second molecular layer striped phase.

Graphical abstract: Crystal growth of para-sexiphenyl on clean and oxygen reconstructed Cu(110) surfaces

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Publication details

The article was received on 16 Feb 2011, accepted on 10 Jun 2011 and first published on 11 Jul 2011


Article type: Paper
DOI: 10.1039/C1CP20413K
Phys. Chem. Chem. Phys., 2011,13, 14675-14684

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    Crystal growth of para-sexiphenyl on clean and oxygen reconstructed Cu(110) surfaces

    J. Novák, M. Oehzelt, S. Berkebile, M. Koini, T. Ules, G. Koller, T. Haber, R. Resel and M. G. Ramsey, Phys. Chem. Chem. Phys., 2011, 13, 14675
    DOI: 10.1039/C1CP20413K

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