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Issue 9, 2011
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Multi-element analysis of bread, cheese, fruit and vegetables by double-focusing sector-field inductively coupled plasma mass spectrometry

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Abstract

An analytical method using double-focusing sector-field ICP MS was developed for the routine simultaneous multi-element analysis for essential and toxic elements (Ag, Al, As, Cd, Co, Cr, Cu, Fe, Hg, In, Li, Ni, Mn, Mo, Pb, Si, Sb, Se, Sn, V and Zn) in different food samples (bread, cheese, fruit and vegetables). Samples were hot-plate digested with a mixture of concentrated HNO3 and H2O2. Interfering ions involving matrix constituents were detected for several elements at the resolution of 300 (typical for a quadrupole analyzer) and could be separated at the 4000 and 10 000 resolution. The method was validated by the analysis of certified reference materials: wheat flour (NIST 1567a), non-fat milk powder (NIST 1549) and brown bread (BCR-IRMM 191). The method used in our laboratory over the period of one year for the analysis of over 300 samples showed a typical interday precision of 3–5% and intraday precision of 5–10% for virtually all the elements and investigated matrices.

Graphical abstract: Multi-element analysis of bread, cheese, fruit and vegetables by double-focusing sector-field inductively coupled plasma mass spectrometry

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Article information


Submitted
10 May 2011
Accepted
11 Jul 2011
First published
11 Aug 2011

Anal. Methods, 2011,3, 2115-2120
Article type
Paper

Multi-element analysis of bread, cheese, fruit and vegetables by double-focusing sector-field inductively coupled plasma mass spectrometry

R. B. Khouzam, R. Lobinski and P. Pohl, Anal. Methods, 2011, 3, 2115
DOI: 10.1039/C1AY05283G

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