Reversed cell imprinting, AFM imaging and adhesion analyses of cells on patterned surfaces
Abstract
* Corresponding authors
a
Ecole Normale Supérieure, CNRS-ENS-UPMC UMR 8640, 24 rue Lhomond, Paris, France
E-mail:
yong.chen@ens.fr
Fax: +33 1 44322402
Tel: +33 1 44322421
b Department of Physics, East China Normal University, Shanghai, China
c Institute for Integrated Cell-Material Science, Kyoto University, Kyoto, Japan
X. Zhou, J. Shi, F. Zhang, J. Hu, X. Li, L. Wang, X. Ma and Y. Chen, Lab Chip, 2010, 10, 1182 DOI: 10.1039/B926325J
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