Structural and physical effects of Mg-doping on p-type CuCrO2 and CuAl0.5Cr0.5O2 thin films†
Abstract
* Corresponding authors
a
Fraunhofer-Institut für Silicatforschung, Neunerplatz 2, Würzburg, Germany
E-mail:
peer.loebmann@isc.fraunhofer.de
Fax: +49 (0)931 4100 559
Tel: +49 (0)931 4100 404
b Lehrstuhl für chemische Technologie der Materialsynthese, Universität Würzburg, Röntgenring 11, Würzburg, Germany
R. Bywalez, S. Götzendörfer and P. Löbmann, J. Mater. Chem., 2010, 20, 6562 DOI: 10.1039/B926424H
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