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Issue 23, 2010
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In situSTXM investigations of pentacene-based OFETs during operation

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Abstract

Ultrathin pentacene-based organic field-effect transistors (OFETs) on commercially available silicon nitride membranes suitable for transmission X-ray experiments are demonstrated. The devices produced by high-vacuum deposition show excellent electronic performance (µ = 0.6 cm2 V−1 s−1, Ion/off = 106). STXM-experiments recorded with the PolLux microspectroscope correlate structural and electronic properties at highest spatial and spectral resolution while the OFET is operated. Local NEXAFS spectra are used to analyze the different orientations of the pentacene nanocrystals. Spectral changes due to modifications in the electronic structure during OFET operation can hardly be detected with the current setup.

Graphical abstract: In situ STXM investigations of pentacene-based OFETs during operation

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Article information


Submitted
15 Feb 2010
Accepted
13 Apr 2010
First published
04 May 2010

J. Mater. Chem., 2010,20, 4884-4887
Article type
Paper

In situ STXM investigations of pentacene-based OFETs during operation

C. Hub, M. Burkhardt, M. Halik, G. Tzvetkov and R. Fink, J. Mater. Chem., 2010, 20, 4884
DOI: 10.1039/C0JM00423E

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