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Issue 10, 2009
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Atomic spectrometry update. X-Ray fluorescence spectrometry

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Abstract

This is the latest review covering atomic spectrometric activities using XRF techniques. It offers a comprehensive review of instrumentation and detectors, matrix correction and spectrum analysis procedures, X-ray optics and micro-fluorescence, SRXRF, TXRF plus handheld and portable XRF as assessed from the published literature. As techniques mature, the application sections have expanded to report developments in sample preparation, geological and industrial minerals, environmental, archaeological, forensic, biological, clinical, thin films, chemical state and speciation studies. They also reflect how the XRF technique is increasingly being used to provide analytical measurements that are then combined with results from more specialised techniques to report comprehensive material characterisation. The commercial availability of silicon drift detectors (SDD) has transformed the handheld EDXRF market this year by extending in situ analytical capabilities down to magnesium. Imaging techniques that provide either 2D or 3D mapping facilities continue to feature this year along with further developments in SR and TXRF systems. The writing team would welcome feedback from readers of this review and invite you to complete the Atomic Spectrometry Updates questionnaire at http://www.asureviews.org.

Graphical abstract: Atomic spectrometry update. X-Ray fluorescence spectrometry

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Publication details

The article was received on 23 Jul 2009, accepted on 23 Jul 2009 and first published on 20 Aug 2009


Article type: Atomic Spectrometry Update
DOI: 10.1039/B915056K
J. Anal. At. Spectrom., 2009,24, 1289-1326

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    Atomic spectrometry update. X-Ray fluorescence spectrometry

    M. West, A. T. Ellis, P. J. Potts, C. Streli, C. Vanhoof, D. Wegrzynek and P. Wobrauschek, J. Anal. At. Spectrom., 2009, 24, 1289
    DOI: 10.1039/B915056K

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