First approximation to the analysis of Ru and Se in carbon nanoparticles as a new voltaic pile system by TXRF
Abstract
This work presents the first analytical study carried out by total-reflection X-ray fluorescence (
* Corresponding authors
a
Servicio Interdepartamental de Investigación, Facultad de Ciencias, Universidad Autónoma de Madrid, Cantoblanco, Madrid, Spain
E-mail:
ramon.fernandez@uam.es
Fax: + 34 91 4973529
Tel: + 34 91 4978581
b Dpto. Química-Física Aplicada C-II, Universidad Autónoma de Madrid, Cantoblanco, Madrid, Spain
This work presents the first analytical study carried out by total-reflection X-ray fluorescence (
R. Fernández-Ruiz, P. Ocon and M. Montiel, J. Anal. At. Spectrom., 2009, 24, 785 DOI: 10.1039/B819922A
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