Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): can cryo-FIB minimize irradiation damage?

Meltem Sezen; Harald Plank; Philipp M. Nellen; Stephan Meier; Boril Chernev; Werner Grogger; Evelin Fisslthaler; Emil J. W. List; Ullrich Scherf; Peter Poelt

doi:10.1039/B816893H

Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): can cryo-FIB minimize irradiation damage?

Meltem Sezen,*^a Harald Plank,^a Philipp M. Nellen,^b Stephan Meier,^b Boril Chernev,^c Werner Grogger,^a Evelin Fisslthaler,^d Emil J. W. List,^d Ullrich Scherf^e and Peter Poelt^a

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* Corresponding authors

^a Institute for Electron Microscopy, Graz University of Technology, Steyrergasse 17, Graz, Austria
E-mail: meltem.sezen@felmi-zfe.at
Fax: +43 316 811 596
Tel: +43 316 873 8335

^b EMPA, Swiss Federal Laboratories for Materials Testing and Research, Electronics/Metrology Laboratory, Ueberlandstrasse 129, Duebendorf, Switzerland
E-mail: stephan.meier@empa.ch
Fax: +41 71 274 7499
Tel: +41 71 274 7474

^c Graz Centre of Electron Microscopy, Graz University of Technology, Steyrergasse 17, Graz, Austria
E-mail: boril.chernev@felmi-zfe.at
Fax: +43 316 811 596
Tel: +43 316 873 8835

^d Institute of Solid State Physics, Graz University of Technology, Petersgasse 16, Graz, Austria
E-mail: e.list@tugraz.at
Fax: +43 316 873 8466
Tel: +43 316 873 8461

^e University of Wuppertal, Macromolecular Chemistry Group, Gausstrasse 20, Wuppertal, Germany
E-mail: scherf@uni-wuppertal.de
Fax: +49 202 439 3880
Tel: +49 202 432493 3871

Abstract

In this study, to assess the influence of the temperature on the ion beam degradation, irradiation experiments on organic semiconductor materials were performed for both cryogenic and room temperature conditions. Thin P3HT films on silicon substrates were exposed to increasing ion doses in dual beam FIB. The degradation behaviour by means of a decrease in the C [double bond, length as m-dash] C band which corresponds to a loss of conjugation was investigated by means of Raman spectroscopy. In addition, atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM) were used for a characterization of morphology and surface potential which provide information on temperature and ion dose dependent degradation behaviour.

Physical Chemistry Chemical Physics

Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): can cryo-FIB minimize irradiation damage?

Abstract

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Ion beam degradation analysis of poly(3-hexylthiophene) (P3HT): can cryo-FIB minimize irradiation damage?

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