A novel procedure for strain classification of fungal mycelium by cluster and artificial neural network analysis of Fourier transform infrared (FTIR) spectra†
Abstract
- This article is part of the themed collection: Optical Diagnosis
* Corresponding authors
a
Molecular Wood Biotechnology and Technical Mycology, Büsgen-Institute, Georg-August-University Göttingen, Büsgenweg 2, 37077 Göttingen, Germany
E-mail:
anauman1@uni-goettingen.de
Fax: +49 551 39 22705
A. Naumann, Analyst, 2009, 134, 1215 DOI: 10.1039/B821286D
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