Issue 12, 2008

PLED devices containing triphenylamine-derived polyurethanes as hole-transporting layers exhibit high current efficiencies

Abstract

The innovative polyurethane-type polymers from a triphenylamine derivative, [N,N′-bis(4-hydroxyphenyl)-N,N′-diphenylbenzidine] (TPA) and a carbazole derivative, [9-butyl-3,6-bis(4-hydroxyphenyl)carbazole] (Cz) can be linked through isophorone diisocyanate (IPDI) bridges and incorporated as hole-transporting layers in high-performance PLED devices. The TPA–IPDI–Cz type of polyurethane (PU) materials (P1–P5) showed superb hole injection and transport properties based on the results of the hole-only-device study. We prepared the devices in two kinds of configuration: system (1) Indium Tin Oxide (ITO)/PU (20 nm)/{Iridium(III) bis(2-phenylpyridine), [Ir(ppy)3] + 2-(4-biphenyl)-5-(4-tert-butylphenyl)-1,3,4-oxadiazole (t-PBD) + polyvinylcarbazole (PVK)] (50 nm)/Mg (10 nm)/Ag (100 nm), for the device with P1 (DP1), the brightness increased to 14 000 cd m−2, the current efficiency rose to 13.4 cd A−1, and the turn-on voltage was reduced to 21 V (at 100 cd m−2). In system (2) ITO/PEDOT–PSS (30 nm)/PU (20 nm)/[Ir(ppy)3 + t-PBD + PVK] (50 nm)/Mg (10 nm)/Ag (100 nm), with PEDOT–PSS as the hole-injection layer, was compared to the standard device (S2) having the configuration ITO/PEDOT–PSS (50 nm)/[Ir(ppy)3 + t-PBD + PVK] (50 nm)/Mg (10 nm)/Ag (100 nm); the brightness of the double layer device with P5 (DDP5) increased to 12 500 cd m−2 and the current efficiency dramatically rose to 34.7 cd A−1, compared with values of 6250 cd m−2 and 21.8 cd A−1, respectively, for S2.

Graphical abstract: PLED devices containing triphenylamine-derived polyurethanes as hole-transporting layers exhibit high current efficiencies

Supplementary files

Article information

Article type
Paper
Submitted
15 Oct 2007
Accepted
03 Jan 2008
First published
29 Jan 2008

J. Mater. Chem., 2008,18, 1296-1301

PLED devices containing triphenylamine-derived polyurethanes as hole-transporting layers exhibit high current efficiencies

C. Ku, C. Kuo, C. Chen, M. Leung and K. Hsieh, J. Mater. Chem., 2008, 18, 1296 DOI: 10.1039/B715929C

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