Issue 4, 2008
From the journal:

Journal of Analytical Atomic Spectrometry

Comment on “Calibration of nitrogen content for GDOES depth profiling of complex nitride coatings” by R. Escobar Galindo, E. Forniés, R. Gago and J. M. Albella, J. Anal. At. Spectrom., 2007, 22, 1512

V. Hoffmanna  

a Institut für Festkorper und Werkstofforschung (IFW), PF 27 00 16, Dresden D-01171, Germany

Abstract

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Comment on “Calibration of nitrogen content for GDOES depth profiling of complex nitride coatings” by R. Escobar Galindo, E. Forniés, R. Gago and J. M. Albella, J. Anal. At. Spectrom., 2007, 22, 1512

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Article information

DOI
https://doi.org/10.1039/B713743P
Article type
Letter
Submitted
06 Sep 2007
Accepted
19 Dec 2007
First published
24 Jan 2008

J. Anal. At. Spectrom., 2008,23, 592-592

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Comment on “Calibration of nitrogen content for GDOES depth profiling of complex nitride coatings” by R. Escobar Galindo, E. Forniés, R. Gago and J. M. Albella, J. Anal. At. Spectrom., 2007, 22, 1512

V. Hoffmann, J. Anal. At. Spectrom., 2008, 23, 592 DOI: 10.1039/B713743P

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