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Issue 48, 2008
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The controlled growth of oriented metal–organic frameworks on functionalized surfaces as followed by scanning force microscopy

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Abstract

Metal–organic frameworks (MOFs) selectively grown on COOH-functionalized surfaces have been investigated by scanning force microscopy. Thickness and surface roughness analysis reveals that the use of a novel protocol based on a layer-by-layer approach results in a controlled growth yielding extremely homogeneous and preferentially oriented materials. The results are described within a sequential growth model and turn out to be promising for building up MOF-based 3D architectures of high quality.

Graphical abstract: The controlled growth of oriented metal–organic frameworks on functionalized surfaces as followed by scanning force microscopy

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Article information


Submitted
28 Jun 2008
Accepted
16 Sep 2008
First published
28 Oct 2008

Phys. Chem. Chem. Phys., 2008,10, 7257-7261
Article type
Paper

The controlled growth of oriented metal–organic frameworks on functionalized surfaces as followed by scanning force microscopy

C. Munuera, O. Shekhah, H. Wang, C. Wöll and C. Ocal, Phys. Chem. Chem. Phys., 2008, 10, 7257
DOI: 10.1039/B811010G

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