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Issue 32, 2007
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Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches

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Abstract

Beyond imaging, atomic force microscopy (AFM) based methodologies enable the quantitative investigation of a variety of physico-chemical properties of (multicomponent) materials with a spatial resolution of a few nanometers. This Feature Article is focused on two AFM modes, i.e. conducting and Kelvin probe force microscopies, which allow the study of electrical and electronic properties of organic thin films, respectively. These nanotools provide a wealth of information on (dynamic) characteristics of tailor-made functional architectures, opening pathways towards their technological application in electronics, catalysis and medicine.

Graphical abstract: Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches

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Publication details

The article was received on 23 Jan 2007, accepted on 09 Mar 2007 and first published on 30 Mar 2007


Article type: Feature Article
DOI: 10.1039/B701015J
Citation: Chem. Commun., 2007,0, 3326-3337
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    Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches

    V. Palermo, A. Liscio, M. Palma, M. Surin, R. Lazzaroni and P. Samorì, Chem. Commun., 2007, 0, 3326
    DOI: 10.1039/B701015J

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