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Issue 32, 2007
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Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches

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Abstract

Beyond imaging, atomic force microscopy (AFM) based methodologies enable the quantitative investigation of a variety of physico-chemical properties of (multicomponent) materials with a spatial resolution of a few nanometers. This Feature Article is focused on two AFM modes, i.e. conducting and Kelvin probe force microscopies, which allow the study of electrical and electronic properties of organic thin films, respectively. These nanotools provide a wealth of information on (dynamic) characteristics of tailor-made functional architectures, opening pathways towards their technological application in electronics, catalysis and medicine.

Graphical abstract: Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches

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Article information


Submitted
23 Jan 2007
Accepted
09 Mar 2007
First published
30 Mar 2007

Chem. Commun., 2007, 3326-3337
Article type
Feature Article

Exploring nanoscale electrical and electronic properties of organic and polymeric functional materials by atomic force microscopy based approaches

V. Palermo, A. Liscio, M. Palma, M. Surin, R. Lazzaroni and P. Samorì, Chem. Commun., 2007, 3326
DOI: 10.1039/B701015J

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