Photoelectrochemical ruler: measurement at the micron scale
Abstract
A new approach to the measurement of objects with dimensions in the micron scale is proposed exploiting the spatial sensitivity of electrochemical measurements.
* Corresponding authors
a
Physical and Theoretical Chemistry Laboratory, Oxford University, South Parks Road, Oxford, UK
E-mail:
richard.compton@chem.ox.ac.uk
Fax: +44 (0) 1865 275 410
Tel: +44 (0) 1865 275 413
b Centro National de Microelectrónica, IMB-CNM, CSIC, Campus de la Universidad Autónoma de Barcelona, Barcelona, Spain
A new approach to the measurement of objects with dimensions in the micron scale is proposed exploiting the spatial sensitivity of electrochemical measurements.
N. Fietkau, J. del Campo, R. Mas, F. X. Muñoz and R. G. Compton, Analyst, 2007, 132, 983 DOI: 10.1039/B711828G
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